Solving long-standing challenge in semiconductor manufacturing—a refined algorithm for detecting wafer defects

This article has been reviewed according to Science X's editorial process and policies . Editors have highlighted the following attributes while ensuring the content's credibility: Research published in the International Journal of Information and Communication Technology may soon help solve a long-standing challenge in semiconductor manufacture: the accurate detection of surface defects on silicon wafers. Crystalline silicon is the critical material used in the production of integrated circuits and in order to provide the computing power for everyday electronics and advanced automotive systems needs to be as pristine as possible...